Altos is an EDA company that provides ultra fast characterization technology to address key nanometer challenges such as low power, yield and process variation.

12.14.09	Altos Release Variety MX for Statistical Memory Characterization (View datasheet)

2009 Press Releases

07.15.09	Altos Launches Liberate MX for Fast and Accurate Memory Characterization (View datasheet, White paper)
07.15.09	CSR Adopts Liberate LV for Library Validation
07.15.09	Altos Announces Liberate LV for Comprehensive Library Validation (View datasheet)
07.15.09	EdXact and Altos Partner to Improve Characterization Performance
03.02.09	Altera Adopts Altos Liberate Cell Characterization for Hardcopy ASIC's
01.23.09	Altos Forms Pal O’Altos Partner Program to Foster IC Yield Improvement and Power Reduction

2008 Press Releases

07.28.08	Altos Variety LX Adopted by STMicroelectronics for ultra-fast Corner and Statistical Characterization at 40nm
06.09.08	Altos Releases Variety LX to enable ultra-fast Corner and Statistical Characterization for 45nm and below
06.05.08	Altos Statistical Timing Models Proven on UMC's 65nm Process
06.03.08	Altos Cell Characterization Tools Used for TSMC's 40nm Libraries

Old Press Releases...

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Liberate and Variety Demos

Interview with Jim McCanny, Altos CEO at EDSFair Jan 2009

News and Articles

08.18.09	Designers - Start Your Characterization Engines
02.24.09	20 Electronics Industry Leaders Collaborate to Accelerate Development and Adoption of Design for E-Beam Technology
01.21.08	EDACafe: Fireside Chat: Rick Lucier & Jim McCanny
12.05.07	SCDsource: The 'Inconvenient Truth' of statistical design
03.01.07	Chip Design: Where's the value in DFM? D or M?
01.15.07	EEtimes: Statistical timing gets modeling boost
01.15.07	EDN: Characterization tool aids SSTA-library creation
01.08.07	EEtimes: Altos closes $1.5M, signs Jim Hogan
07.25.06	EEtimes: Firms partner on standard statistical analysis library format
07.17.06	EEtimes: What's Hot at DAC?
07.03.06	EEtimes: Startup to 'Liberate' library characterization
07.03.06	EEtimes: Statistical timing revs for 45-nm era
07.03.06	ElectronicNews: Altos Targets Statistical Timing Models